The P-733 platform achieves high-repeatability motion through a design that prioritizes stability. By utilizing parallel kinematics and metrology, the stage ensures that all axes are measured against a common fixed reference, effectively compensating for crosstalk and guiding errors. This architecture is paired with a 50 by 50 millimeter clear aperture, making the unit suitable for transmitted-light microscopy and other optical imaging techniques where sample access is critical.
PI Launches Angstrom-Level XYZ Nanopositioning Stage
With a positioning resolution of 0.1 nanometers, Physik Instrumente’s new P-733 piezo stage brings sub-atomic precision to fields ranging from atomic force microscopy to wafer metrology. The system integrates frictionless flexure guidance with capacitive feedback to maintain accuracy across multi-axis scanning tasks in demanding scientific and industrial environments.
For high-throughput requirements, PI offers the P-733.3DD direct-drive variant. This model maintains the 0.1 nanometer resolution while boosting dynamic performance, with resonant frequencies exceeding 1 kilohertz to support rapid scanning and minimal settling times. The entire series relies on zero-play flexure guides and PICMA multilayer piezo actuators, which eliminate mechanical friction and backlash to ensure long-term reliability. To accommodate specialized research needs, the company provides both ultra-high-vacuum-compatible and nonmagnetic configurations.
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